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The NTE4511B (16−lead DIP) and NTE4511BT (SOIC−16) BCD−to−seven segment latch/decoder/drivers are constructed with complementary MOS (CMOS) enhancement mode devices and NPN bipolar output drivers in a single monolithic structure. The circuit provides the functions of a 4−bit storage latch, an 8421 BCD−to−seven segment decoder and an output drive capability. Lamp test (LT), blanking (BI) and latch enable (LE) inputs are used to test the display, to turn off or pulse modulate the brightness of the display and to store a BCD code, respectively. It can be used with seven−segment LEDs, incandescent, fluorescent, gas discharge or liquid crystal readouts either directly or indirectly. Applications include instrument (e.g., counter, DVM, etc.), display driver, computer/calculator display driver, cockpit display driver and various clock, watch and timer uses.
VDD = −0.5 to +18.0V
Vin = −0.5 to VDD + 0.5V
I (per pin) = 10mA
IOHmax = 25mA
POHmax = POHmax = IOH (VDD − VOH), = 50mW
TA = −55 to +125°C
Tstg = −65 to +150°C
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These devices contain circuitry to protect the inputs against damage due to high static voltages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than maximum rated voltages to this high impedance circuit. A destructive high current mode may occur if Vin and Vout is not constrained to the range VSS ≤ (Vin or Vout) ≤ VDD. Due to the sourcing capability of these circuits, damage can occur to the device if VDD is applied, and the outputs are shorted to VSS and are at a logical 1 (see absolute maximum ratings). Unused inputs must always be tied to an appropriate logic voltage level (e.g., either VSS or VDD).