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NTE5608 - TRIAC-400VRM 8A GATE

Model:

NTE5608

 | Catalog #: 55053086
Price:
$3.70
$3.70
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0

  • Repetitive peak off--state voltage (gate open, TJ = +110°C), VDRM = 400V
  • RMS on--state current (TC = +80°C, conduction angle = 360°), IT(RMS) = 4A
  • Non--repetitive peak surge on--state current (one--cycle, at 50Hz or 60Hz), ITSM = 40A
  • Peak gate--trigger current (for 3μs max), IGTM = 1.2A
  • Peak gate--power dissipation (IGT ≤ IGTM), PGM = 15W
  • Topr = --40° to +110°C
  • RthJC = 4°C/W typically
  • Above values are absolute maximums - to exceed them may damage the device

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NTE5631 - TRIAC-50VRM 10A
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NTE5631 - TRIAC-50VRM 10A

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0

  • Repetitive peak off--state voltage (TJ = --40° to +125°C, RGK = 1kΩ), VDRM: 50V
  • On--state current (all conduction angles, TC = +85°C), IT(RMS): 10A
  • Non--repetitive on--state current (half cycle), ITSM
    60Hz:110A
    50Hz: 100A
  • Fusing current (t = 10ms), I2t: 50A2s
  • Peak gate current (t = 10μs Max), IGM: 4A
  • Peak gate dissipation (t = 10μs Max), PGM: 10W
  • Gate dissipation (t = 20ms Max), PG(AV): 1W
  • Operating junction temperature range, TJ: --40° to +125°C
  • Storage temperature range, Tstg: --40° to +125°C
  • Thermal resistance, junction--to--case, RthJC: 2.5K/W
  • Thermal resistance, junction--to--ambient, RthJA: 60K/W
  • Lead temperature (during soldering, 1.6mm from case, 10sec max), TL: +250°C

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Product Summary

The NTE5608 through NTE5610 series of TRIACs are high-performance glass-passivated PNPN devices in a TO220-type package designed for general purpose applications where moderate gate sensitivity is required.

  • (TJ = --40° to +125°C, RGK = 1kΩ), VDRM = 400V
  • TC = +85°C), IT(RMS) = 8A
  • TC = +85°C), IT(RMS) = 8A
  • Half Cycle, ITSM
    60Hz = 77A
    50Hz = 70A
  • (t = 10ms), I²t = 24A²ts
  • (t = 10μs mMax), IGM = 4A
  • (t = 10μs Max), PGM = 10W
  • (t = 20ms Max), PG(AV) = 1W
  • TJ = --40° to +125°C
  • Tstg = --40° to +125°C
  • RthJC = 3K/W
  • RthJA = 60K/W
  • TL = +250°C
  • Above ratings are maximum values and exceeding them may damage the device
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